Published 2003
| Version v1
Miscellaneous
X-ray imaging of semiconductor micro- and nanostructures in real and reciprocal space
Description
no abstract available
Additional details
Additional titles
- Augmented title (English)
- Indium phosphides and other semiconductors
Publishing Information
- Imprint Title
- Abstracts of The European Materials Conference E-MRS 2003 Fall Meeting
- Imprint Pagination
- 287 p.
- Journal Page Range
- p. 67
Conference
- Title
- European Materials Conference E-MRS 2003 Fall Meeting
- Dates
- 15-19 Sep 2003
- Place
- Warsaw (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 35101072
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- FABRICATION; GALLIUM ARSENIDES; GALLIUM NITRIDES; GALLIUM PHOSPHATES; IMAGES; INDIUM PHOSPHIDES; MICROSTRUCTURE; NANOSTRUCTURES; SEMICONDUCTOR MATERIALS; SILICON; SILICON CARBIDES; SYNCHROTRON RADIATION; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; BREMSSTRAHLUNG; CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PHOSPHATES; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; RADIATIONS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS