Using VEhU-1 secondary-emission electron multiplier for measuring pulse electron beam parameters

Possibility of using VEhU-1 secondary-emission electron multiplier (SEM) for measuring pulse electron beam parameters in the range of currents of 1-100 μA, electron energy of 100-1000 eV, the error being approximately 10 %, is experimentally investigated. Time resolution of beam current pulse shape is approximately 20 ns. A block-diagram of experimental device for measuring SEM characteristics is presented. Dependences of SEM gain factor on the beam current input pulse parameters are given. The current pulse distortions at SEM output in longitudinal magnetic field of 40-100 G are absent when the pulse charge is below approximately 300 pC. Amplitude of the amplified current pulses is 700-30 μA in the range of 0.5-10 μs pulse duration