Published May 2003
| Version v1
Journal article
Xe(L) X-ray emission from laser-cluster interaction
Description
We have measured quantitative L X-ray emission yields from (Xe)n clusters (with n between 104 and 106 atoms/cluster) irradiated by 60 fs 800 nm IR and 180 fs 400 nm UV laser pulses of 1015-1017 W cm-2 peak intensity. Measurements have been performed as a function of cluster size (backing pressure) and laser peak intensity. Identification of spectroscopic features as well as X-ray emission yield variation with laser wavelength, intensity and cluster size are in strong contradiction with results and interpretation from previous studies
Additional details
Identifiers
- PII
- S0168583X03005949;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 205
- Journal Issue
- 1-4
- Journal Page Range
- p. 341-345
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. international conference on the physics of highly charged ions
- Dates
- 1-6 Sep 2002
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077473
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC CLUSTERS; COMPARATIVE EVALUATIONS; IRRADIATION; LASER RADIATION; MEASURING METHODS; PULSES; ULTRAVIOLET RADIATION; WAVELENGTHS; X-RAY EMISSION ANALYSIS; XENON
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; EVALUATION; FLUIDS; GASES; NONDESTRUCTIVE ANALYSIS; NONMETALS; RADIATIONS; RARE GASES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.