X-ray characterization of in-plane ordering in YBa2Cu3O7-x thin films using a standard Weissenberg camera

We have used a standard Weissenberg camera in the oscillating mode to characterize the in-plane structure of YBa2Cu3O7 thin films. We find that for films optimally grown on (100) MgO or (100) SrTiO3 substrates, the in-plane film axes are aligned parallel to the substrate axes. This is true both for solely c-axis oriented films (perpendicular to the film plane) and for mixed a- and c-axis oriented films. For a film grown on (110) SrTiO3, we have established that the film orientation perpendicular to the film plane is solely (103) and not (110) or a mixture of the two. In addition the in-plane film axes are colinear to the substrate axes