Published February 1, 2012 | Version v1
Journal article

Modifications in SnS thin films by plasma treatments

  • 1. Instituto de Ciencias Físicas, Universidad Nacional Autónoma de México, Apartado Postal 48-3, 62210 Cuernavaca, Morelos (Mexico)
  • 2. Facultad de Ingeniería Mecánica y Eléctrica, Universidad Autónoma de Nuevo León (Mexico)

Description

The present study shows the modifications of structural, optical and electrical characteristics that occur in tin sulfide (SnS) thin films treated in air and in nitrogen plasma at different pressure conditions. The films were obtained by the chemical bath deposition method, which results in SnS thin films with an orthorhombic crystalline structure, band gap (Eg) of 1.1–1.2 eV, and electrical conductivities (σ) in the order of 10−6 Ω−1cm−1. The films treated with air plasma at pressures between 1 and 4 Torr, showed the presence of SnS2, Sn2S3, and SnO2 phases, within the band gap values ranging from 0.9 to 1.5 eV. On the other hand, the films treated with nitrogen plasma presented the same phases, but showed a significant modification in the electrical conductivity, increasing from 10−6 Ω−1cm−1 (as-deposited) up to 10−2–10−3 Ω−1cm−1 (plasma treated). This result is a suitable range of conductivity for the improvement of the solar cells with SnS as an absorber material. Also, emission spectroscopy measurements were carried out in both air and nitrogen plasma treatments.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2011.01.099

Additional details

Identifiers

DOI
10.1016/j.nimb.2011.01.099;
PII
S0168-583X(11)00122-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
272
Journal Issue
Complete
Journal Page Range
p. 351-356
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
17. international conference on ion beam modification of materials
Acronym
IBMM 2010
Dates
22-27 Aug 2010
Place
Montreal, PQ (Canada)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.