Published October 2002
| Version v1
Journal article
Microstructure and phase of titanium dioxide films prepared by screen-printing technique
- 1. Universiti Tenaga Nasional, Kajang (Malaysia). College of Engineering
- 2. Universiti Kebangsaan Malaysia, Bangi (Malaysia). School of Applied Physics
Description
This paper deals with the characterization of titanium dioxide. TiO2 film, which was deposited on ITO covered glass substrate by screen-printing technique. The films were deposited once and twice on the substrate and then annealed at temperature of 300 degree C, 350 degree C and 4000 degree C. The films were characterized by the techniques of x-ray diffraction (XRD), energy dispersive analysis by x-rays (EDX) and scanning electron microscopy (SEM). The results are presented in this paper. (Author)
Additional details
Publishing Information
- Journal Title
- Malaysian Journal of Science Series B Physical and Earth Sciences
- Journal Volume
- 21A
- Journal Page Range
- p. 157-160
- ISSN
- 1394-3065
- CODEN
- MJSBFN
Conference
- Title
- ICXRI 2002 - International Conference on X-rays and Related Techniques in Research and Industry
- Dates
- 30-31 Oct 2002
- Place
- Shah Alam (Malaysia)
INIS
- Country of Publication
- Malaysia
- Country of Input or Organization
- Malaysia
- INIS RN
- 37036354
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; FILMS; GLASS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SCREEN PRINTING; SUBSTRATES; TITANIUM OXIDES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; HEAT TREATMENTS; IONIZING RADIATIONS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SURFACE COATING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS