Published September 5, 2024
| Version v1
Journal article
Measuring the multifunctional properties of across the amorphous-crystalline transition using colorimetric sensing
Creators
- 1. Laboratory for Nanometallurgy, ETH Zurich, 8093 Zürich, Switzerland
- 2. Laboratory of Ion Beam Physics, ETH Zurich, 8093 Zürich, Switzerland
Description
Molybdenum disulfide () is a next-generation semiconductor and is frequently integrated into emergent optoelectronic technologies based on two-dimensional materials. Here, we present a method that provides direct optical feedback on the thickness and crystallinity of sputter-deposited down to the few-layer regime. This colorimetric sensing enables tracking the material's functional properties, such as excitonic response, sheet resistance, and hardness across the amorphous-crystalline transition. To illustrate the potential of such feedback-controlled fabrication, we realized -based hyperbolic metamaterials (HMMs) with controllable optical topological transitions and hardness.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevB.110.115303;
- Crossref Funder ID
- 10.13039/501100003006;
Publishing Information
- Journal Title
- Physical Review B
- Journal Volume
- 110
- Journal Issue
- 11
- Journal Page Range
- 11 pgs.
- ISSN
- 1550-235X
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; COLOR; CRYSTALS; DEPOSITS; EXCITONS; FABRICATION; FEEDBACK; HARDNESS; LAYERS; METAMATERIALS; MOLYBDENUM; OPTOELECTRONIC DEVICES; SEMICONDUCTOR MATERIALS; SPUTTERING; THICKNESS; TOPOLOGY
- Descriptors DEC
- DIMENSIONS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; MATERIALS; MATHEMATICS; MECHANICAL PROPERTIES; METALS; OPTICAL EQUIPMENT; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; PHYSICAL PROPERTIES; QUASI PARTICLES; REFRACTORY METALS; TRANSDUCERS; TRANSITION ELEMENTS
Optional Information
- Copyright
- ©2024 American Physical Society
- Notes
- Contact Email: Contact author: joseo@ethz.ch; Contact Email: Contact author: henningg@ethz.ch; http://met.mat.ethz.ch; Record automatically processed
- Funding organization
- Eidgenössische Technische Hochschule Zürich