Published August 1994 | Version v1
Journal article

CVD diamond films for radiation detection

  • 1. Centre d'Etudes de Saclay, Gif-sur-Yvette (France)
  • 2. Lab. d'Etudes des Proprietes Electroniques des Solides, Grenoble (France)

Description

Diamond films produced by microwave plasma enhanced chemical vapor deposition (CVD) technique have been used to fabricate radiation detectors. The polycrystalline diamond films have a measured resistivity of 1012 Ω.cm, a carrier mobility of 280 cm2/V.s and a carrier lifetime of about 530 ps. The detector response to laser pulses (λ = 355, 532 and 1,064 nm), X-ray flux (15--50 keV) and alpha particles (241Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3 x 10-10 A/V. (Gy/s) was measured under 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
41
Journal Issue
4Pt1
Journal Page Range
p. 927-932.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
nuclear science symposium and medical imaging conference.
Acronym
NSS-MIC '93
Dates
30 Oct - 6 Nov 1993.
Place
San Francisco, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26026345
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ALPHA DETECTION; ELECTRICAL PROPERTIES; EXPERIMENTAL DATA; FABRICATION; PERFORMANCE; RESPONSE FUNCTIONS; SEMICONDUCTOR DETECTORS; SENSITIVITY; X-RAY DETECTION
Descriptors DEC
CHARGED PARTICLE DETECTION; DATA; DETECTION; FUNCTIONS; INFORMATION; MEASURING INSTRUMENTS; NUMERICAL DATA; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS

Optional Information

Secondary number(s)
CONF-931051--.