Electrochemical characteristics of La-Ni-Al thin films
- 1. School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052 (Australia)
- 2. Center of Materials Science and Engineering, Guilin University of Electronic Technology, Guilin, Guangxi 541004 (China)
- 3. Institute of Metal Research, Chinese Academy of Sciences (China)
Description
AB5 based hydrogen storage thin films (LaNi4.25Al0.75), deposited on Cu substrate by dc magnetron sputtering, have been investigated in this paper. X-ray diffraction (XRD) revealed that the microstructure of the film was in crystal form. SEM, AFM and FIB analyses proved that on the surface there were many pores of approximately 15-40 nm in diameter of random size. The cross section of the film revealed that it was rather dense and defect-free, with a uniform thickness of about 4.2 μm. Electrochemical properties of the films were measured by simulated battery tests. The single layer LaNi4.25Al0.75 film undergoes a longer activation period than typical AB5 alloys in bulk and the maximum discharge capacity of the film was about 220 mAh/g. Two electrochemical behaviour (distinct to the bulk materials) were observed for the film electrode in which there was an apparent increase in intermediate potential for each discharge process, as well as a local increase of discharge potential during its activation period
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2007.02.058Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2007.02.058;
- PII
- S0925-8388(07)00433-1;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 456
- Journal Issue
- 1-2
- Journal Page Range
- p. 407-412
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40011729
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; ATOMIC FORCE MICROSCOPY; CROSS SECTIONS; CRYSTALS; ELECTROCHEMISTRY; HYDROGEN STORAGE; LANTHANUM ALLOYS; LAYERS; MICROSTRUCTURE; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; SIMULATION; SPUTTERING; SURFACES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; MICROSCOPY; RARE EARTH ALLOYS; SCATTERING; STORAGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.