Element analysis based on nuclear excitation in the field of solid state physics

New methods developed in order to solve different analytical problems are described. The methods based on nuclear reactions due to neutron, proton, deuteron or alpha particle excitations using WWR-M reactor or Van de Graaf generator. C and N were determined in tungsten and in semiconductors and O was determined in the surface layers of the latter. The impurity determination in metals and alloys used in the metal and semiconductor industry, as well as the applications of the results in different fields are given. (Sz.J.)