Published December 1984
| Version v1
Journal article
Statistical procedures for determining electronic part design margin breakpoints
Description
This note presents a set of statistical procedures for accepting or rejecting part types on the basis of lot sample tests-to-failure or parameter degradation tests of parts subject to weapon-induced environments
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- NS-31
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1423-1426
- ISSN
- 0018-9499
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16077944
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ELECTRONIC EQUIPMENT; FAILURES; MACHINE PARTS; PERFORMANCE TESTING; SPECIFICATIONS; STATISTICS
- Descriptors DEC
- EQUIPMENT; MATHEMATICS; TESTING