Structural and electronic properties of thallium overlayers on the Si(111)-7x7 surface
Creators
- 1. Department of Molecular and Material Sciences, Kyushu University, Kasuga, Fukuoka 816-8580 (Japan)
- 2. Department of Physics, University of Seoul, Seoul 130-743 (Korea, Republic of)
- 3. Supercomputing Center, KISTI, P.O.Box 122, Yusung, Taejon 305-600 (Korea, Republic of)
- 4. IQUIPS, University of Seoul, Seoul 130-743 (Korea, Republic of)
- 5. Physics Department and Basic Science Research Institute, Pohang University of Science and Technology, San 31 Hyoja Dong, Pohang 790-784 (Korea, Republic of)
Description
We have investigated atomic arrangements and their electronic properties of the well-ordered thallium overlayer structures formed on the Si(111)-7x7 surface. As for other trivalent atoms, Tl is found to form a well-defined √(3)x√(3) surface, indicating the absence of a so-called 'inert pair effect' considered only for Tl. Another well ordered 1x1 surface at 1.0 monolayer appears to be semiconducting in our angle-resolved photoemission spectra dominated by a unique dispersive surface band near the Fermi level. Our theoretical calculations using density-functional theory show that Tl adatoms occupy the T4 sites and saturate all the dangling bonds of surface Si atoms to make the surface semiconducting with a band gap of 0.34 eV. The filled surface band observed has been well reproduced in our band calculations
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 66
- Journal Issue
- 23
- Journal Page Range
- p. 233312-233312.4
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36001418
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADSORPTION; BRILLOUIN ZONES; DENSITY FUNCTIONAL METHOD; ELECTRON DIFFRACTION; ENERGY GAP; FERMI LEVEL; MILLI EV RANGE; PHOTOEMISSION; SILICON; SPECTRA; SURFACES; THALLIUM; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; ENERGY LEVELS; ENERGY RANGE; METALS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SECONDARY EMISSION; SEMIMETALS; SORPTION; SPECTROSCOPY; VARIATIONAL METHODS; ZONES
Optional Information
- Notes
- (c) 2002 The American Physical Society