Published 2000 | Version v1
Miscellaneous

Determination of sulphur with total reflection x-ray spectrometry

  • 1. Johann Wolfgang Goethe-University, Institute of Inorganic Chemistry/Analytical Chemistry, Marie Curie Strasse 11, 60439 Frankfurt am Main (Germany)

Description

The potential and limitations of total reflection x-ray spectrometry (TXRF) were tested for the quantitative determination of the light element sulphur in inorganic and biological samples. As representatives of inorganic samples alkali, transition metal, magnesium and aluminum sulphates were investigated. As biological samples the sulphur containing amino acid methionine and the pharmaceutical drug insulin were chosen. All measurements were performed on a TXRF-spectrometer EXTRA IIA (Atomika Instruments, Oberschleissheim/Germany) using tungsten L-radiation as the excitation tube. Various concentrations of all samples ranging from 20 mg/l to 0.5 mg/l were determined. In addition the surface topography and thickness of the dry residue of these samples were investigated with SEM and a thickness profilometer (Alpha-Step). The result show that the reliable determination of sulphur in sulphates depends on the cation involved. Alkali sulphates like Na2SO4, or K2SO4 form bulky residues resulting in significant deviations of the recovery rate of sulphur. In this case the use of smoothing detergents like 1 % HF, 1 % malic acid and 2 % hydrazinhydrat was found to be necessary for accurate determination. The results for the biological samples agree well with the expected values. The investigations lead to the conclusion that TXRF combined with a proper samples preparation is well suited for the determination of sulphur in different samples with various concentrations and matrices. (author)

Part of:
Abstracts of the 8th Conference on total reflection x-ray fluorescence analysis and related methods

Additional details

Publishing Information

Publisher
Atominstitut der oesterreichischen Universitaeten, Technische Universitaet Wien
Imprint Place
Vienna (Austria)
Imprint Title
8. conference on total reflection x-ray fluorescence analysis and related methods
Imprint Pagination
108 p.
Journal Page Range
p. 60

Conference

Title
8. conference on total reflection x-ray fluorescence analysis and related methods
Dates
25-29 Sep 2000
Place
Vienna (Austria)

INIS

Country of Publication
Austria
Country of Input or Organization
Austria
INIS RN
32022116
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
FLUORESCENCE SPECTROSCOPY; REFLECTION; SULFUR; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; ELEMENTS; EMISSION SPECTROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information