Molecular dynamics study of Pb-substituted Cu(1 0 0) surface layers
Creators
- 1. Department of Physics, University of Ioannina, PO Box 1186, Ioannina 45110 (Greece)
- 2. Laboratoire des Solides Irradies, CEA-DRECAM, 91191 Gif-sur-Yvette Cedex (France)
Description
Using molecular dynamics (MD) and phenomenological n-body potentials from the literature, we have studied the structure of the uppermost layers of low-index surfaces in copper after partial substitution of copper by lead atoms at randomly selected sites. We found that lead atoms substituting copper strongly perturb the positions of nearest and of next-nearest neighbors thus triggering the setup of a disordered, nanometer-thick amorphous-like surface layer. Equilibrium atomic density profiles, computed along the [1 0 0] crystallographic direction, show that amorphous overlayers are largely metastable whereas the system displays a structured compositional profile of lead segregating at the interfaces. Similarities between our results and experimental findings are briefly discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2008.07.221Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2008.07.221;
- PII
- S0925-8388(08)01970-1;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 483
- Journal Issue
- 1-2
- Journal Page Range
- p. 662-664
- ISSN
- 0925-8388
- CODEN
- JALCEU
Conference
- Title
- 14. international symposium on metastable and nano-materials
- Acronym
- ISMANAM-2007
- Dates
- 26-30 Aug 2007
- Place
- Corfu (Greece)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41098855
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; LAYERS; LEAD; MOLECULAR DYNAMICS METHOD; NANOSTRUCTURES; SIMULATION; SURFACES
- Descriptors DEC
- CALCULATION METHODS; ELEMENTS; METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.