Published September 21, 2007 | Version v1
Journal article

Edge enhanced X-ray phase tomography

  • 1. Department of Physics, University of Science and Technology of China, Hefei 230026 (China)
  • 2. Institute of High Energy Physics, Chinese Academy of Science, Beijing 100039 (China)
  • 3. Graduate University of Chinese Academy of Sciences, 100049 (China)

Description

Sample parameters that are involved in the projection data of Computed Tomography reconstruction have to fulfill the rotational invariance, i.e., the contribution to the projection data of a single sample point has to be invariant respect to the illumination direction. In the reconstruction procedure of the Diffraction Enhanced Peak Imaging (DEPI) technique, while the Inverse Radon Transform is fulfilled, the rotation invariance is no longer satisfied because of the contribution induced by refraction at the edge of the sample. However, DEPI experimental results address the question how the edge contrast is generated. In this contribution, theoretical simulations of DEPI have been performed to investigate the edge contrast due to the refraction process and to test the rotation invariance condition of the DEPI-CT reconstruction algorithm

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2007.05.127

Additional details

Identifiers

DOI
10.1016/j.nima.2007.05.127;
PII
S0168-9002(07)00990-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
580
Journal Issue
1
Journal Page Range
p. 617-620
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
10. international symposium on radiation physics
Acronym
ISRP 10
Dates
17-22 Sep 2006
Place
Coimbra (Portugal)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39062173
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; COMPUTERIZED TOMOGRAPHY; DIFFRACTION; ILLUMINANCE; OPTICS; PEAKS; RADON; REFRACTION; ROTATION; ROTATIONAL INVARIANCE; SIMULATION; X RADIATION
Descriptors DEC
COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; INVARIANCE PRINCIPLES; IONIZING RADIATIONS; MATHEMATICAL LOGIC; MOTION; NONMETALS; RADIATIONS; RARE GASES; SCATTERING; TOMOGRAPHY

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.