Edge enhanced X-ray phase tomography
Creators
- 1. Department of Physics, University of Science and Technology of China, Hefei 230026 (China)
- 2. Institute of High Energy Physics, Chinese Academy of Science, Beijing 100039 (China)
- 3. Graduate University of Chinese Academy of Sciences, 100049 (China)
Description
Sample parameters that are involved in the projection data of Computed Tomography reconstruction have to fulfill the rotational invariance, i.e., the contribution to the projection data of a single sample point has to be invariant respect to the illumination direction. In the reconstruction procedure of the Diffraction Enhanced Peak Imaging (DEPI) technique, while the Inverse Radon Transform is fulfilled, the rotation invariance is no longer satisfied because of the contribution induced by refraction at the edge of the sample. However, DEPI experimental results address the question how the edge contrast is generated. In this contribution, theoretical simulations of DEPI have been performed to investigate the edge contrast due to the refraction process and to test the rotation invariance condition of the DEPI-CT reconstruction algorithm
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.05.127Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.05.127;
- PII
- S0168-9002(07)00990-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 580
- Journal Issue
- 1
- Journal Page Range
- p. 617-620
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 10. international symposium on radiation physics
- Acronym
- ISRP 10
- Dates
- 17-22 Sep 2006
- Place
- Coimbra (Portugal)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39062173
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; COMPUTERIZED TOMOGRAPHY; DIFFRACTION; ILLUMINANCE; OPTICS; PEAKS; RADON; REFRACTION; ROTATION; ROTATIONAL INVARIANCE; SIMULATION; X RADIATION
- Descriptors DEC
- COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; INVARIANCE PRINCIPLES; IONIZING RADIATIONS; MATHEMATICAL LOGIC; MOTION; NONMETALS; RADIATIONS; RARE GASES; SCATTERING; TOMOGRAPHY
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.