Published August 2008 | Version v1
Journal article

Critical-current density of melt-grown single-grain Y-Ba-Cu-O disks determined by ac susceptibility measurements

  • 1. ICREA and Departament de Fisica, Universitat Autonoma de Barcelona, 08193 Bellaterra, Barcelona (Spain)
  • 2. Departament de Fisica, Universitat Autonoma de Barcelona, 08193 Bellaterra, Barcelona (Spain)
  • 3. Engineering Department, University of Cambridge, Trumpington Street, Cambridge CB2 1PZ (United Kingdom)

Description

The field amplitude and frequency dependent complex ac susceptibility χ(Hm,f) of three Y-Ba-Cu-O disks made by a top-seeded melt growth technique has been measured at 77 K with the ac field applied along the c-axis of the samples (parallel to their thickness). A procedure based on the Bean model has been developed to calculate the critical-current density Jc near the surface of the sample from the measured χ(Hm) for the case where the maximum imaginary component χ'' is not reached

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-2048/21/8/085013

Additional details

Identifiers

DOI
10.1088/0953-2048/21/8/085013;
PII
S0953-2048(08)76970-7;

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
21
Journal Issue
8
Journal Page Range
[6 p.]
ISSN
0953-2048
CODEN
SUSTEF

INIS