Parameter test method for radiation damage of CCDs

To better carry out the research of CCD irradiation effects, the test method of CCD irradiation damage parameters was built. It can quantitatively test and analysis CCD irradiation damage accurately and efficiently combining with the radiation effects testing system of optical imaging devices in Xinjiang technical institute of physics and chemistry. Testing parameters including the dark signal, charge transfer efficiency, saturation output signal, photoresponse non-uniformity, fixed pattern noise, spectrum response and so on. The parameters' variation of one TDI-CCD in Co-60 ray source irradiation was obtained applying this method. It shows that the test method is in favor of analysis of CCD irradiation damage, which provides a good technical support for research of CCD irradiation effects and evaluation of irradiation performance. (authors)