Published August 2016 | Version v1
Journal article

Junction parameters and characterization of Au/n-Ge15In5Se80/p-Si/Al heterojunction

  • 1. Ain Shams University, Physics Department, Faculty of Education, Roxy, Cairo (Egypt)
  • 2. Ain Shams University, Physics Department, Faculty of Science, Abassia, Cairo (Egypt)
  • 3. High Institute of Engineering and Technology, Basic Science Department, El-Arish, North Sinai (Egypt)

Description

The analysis of the electrical properties of Au/n-Ge15In5Se80/p-Si/Al heterojunction is examined. I-V characteristics show diode-like behavior. The series resistance is found to decrease with increasing the temperature in three different methods of calculations. The thermionic emission mechanism is found to be the operating mechanism at relatively low forward voltages (V < 0.25). While, at relatively high forward voltage, the space charge limited conduction is the operating mechanism. The rectification ratio, ideality factor, barrier height, total trap concentration and built-in voltage are determined. The capacitance-voltage (C-V) characteristics of Au/n-Ge15In5Se80/p-Si/Al heterojunction are also investigated. The I-V curve of the Au/n-Ge15In5Se80/p-Si/Al heterojunction in the dark and after illumination is clarified. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-016-0316-0

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
122
Journal Issue
8
Journal Page Range
p. 1-8
ISSN
0947-8396
CODEN
APAMFC