Published January 15, 2006
| Version v1
Journal article
Chemical etching of InP (1 0 0) wafer based on a volcanic mineral water
Creators
- 1. Department of Electronic Engineering, Faculty of Engineering, Gunma University, Tenjin-cho 1-5-1, Kiryu-shi, Gunma 376-8515 (Japan)
Description
We have successfully demonstrated that a solution of spa water [Tamagawa Spa water (TaSW):H2O2 = 1:1] etches InP (1 0 0) wafer. The TaSW is a colorless acidic liquid of pH ∼1.1. It contains a considerable amount of positive ions, such as H+, Al3+, and Ca2+. The Cl-, HSO42-, and SO42- ions are the main anions. The TaSW-etchant system provides shiny flat surfaces on the etched bottoms. The spa-etchant system has reproducible etching rates and does not erode photoresist masks. The etching kinetics is reaction-rate limited. The spa-etchant system is also found to etch GaAs (1 0 0) wafer, but the etched surface is considerably roughened
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2005.08.108;
- PII
- S0921-5107(05)00556-8;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 126
- Journal Issue
- 1
- Journal Page Range
- p. 49-52
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37120716
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM IONS; CALCIUM IONS; CHLORINE IONS; ETCHING; GALLIUM ARSENIDES; HYDROGEN IONS 1 PLUS; HYDROGEN PEROXIDE; INDIUM PHOSPHIDES; LIQUIDS; MINERALS; PH VALUE; REACTION KINETICS; SEMICONDUCTOR MATERIALS; SULFATES; SURFACES; WATER
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CATIONS; CHARGED PARTICLES; FLUIDS; GALLIUM COMPOUNDS; HYDROGEN COMPOUNDS; HYDROGEN IONS; INDIUM COMPOUNDS; IONS; KINETICS; MATERIALS; OXYGEN COMPOUNDS; PEROXIDES; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SULFUR COMPOUNDS; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.