Published 2017
| Version v1
Journal article
ATLAS ITk silicon strip module production in Dortmund
Creators
- 1. TU Dortmund, Experimentelle Physik IV (Germany)
Description
To be able to deliver satisfactory tracking performance after the LHC High Luminosity upgrade, the ATLAS inner detector will be replaced during Long Shutdown 3 with a new all-silicon-detector, the Inner Tracker (ITk), featuring pixel and strip sensors. Modules for the strip endcaps will be produced in Dortmund. One endcap consists out of six disks and each disk will be populated by 32 petals. Each petal will include six different module designs. The necessary preparations for production as well as the assembly and testing of modules are presented.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Muenster 2017 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 52(4)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 81. Annual meeting of DPG and DPG Spring meeting 2017 of the divisions on hadronic and nuclear physics, radiation and medical physics, particle physics and the working groups on equal opportunities, energy, information, young DPG, physics and disarmament
- Original Conference Title
- 81. Jahrestagung der DPG und DPG-Fruehjahrstagung 2017 der Fachverbaende Physik der Hadronen und Kerne, Strahlen- und Medizinphysik, Teilchenphysik und Arbeitskreise Chancengleichheit, Energie, Industrie und Wirtschaft sowie der Arbeitsgruppen Information, junge DPG, Physik und Abruestung
- Dates
- 27-31 Mar 2017
- Place
- Muenster (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 50000554
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATLAS DETECTOR; MODULAR STRUCTURES; PRODUCTION; SI MICROSTRIP DETECTORS; TESTING
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- Session: T 72.2 Di 16:45; No further information available