Published May 1994 | Version v1
Journal article

Reactions at solid state surfaces and thin films by means of in situ electron microscopy

Creators

  • 1. Inst. fuer Festkoerperanalytik und Strukturforschung, IFW e.V., Dresden (Germany)

Description

A survey is presented of modern in situ electron microscopic techniques; the possibilities for studying solid state interactions are discussed. These comprise reactions at solid state surfaces and at thin films, caused by in situ SEM and TEM techniques. The information content of the electron microscopic investigations can be enlarged by these techniques, as it will be shown for different applications. Trends towards a ''microlab'' inside the microscope with complementary in situ techniques are also discussed. (orig.)

Additional details

Additional titles

Augmented title (English)
Si; MgO-TiO_2; Ge; Cu; InSbSn; ZnO

Publishing Information

Journal Title
Fresenius' Journal of Analytical Chemistry
Journal Volume
349
Journal Issue
1-3
Journal Page Range
p. 64-70.
ISSN
0937-0633
CODEN
FJACES

Conference

Title
7. conference on solid-state analysis.
Original Conference Title
7. Tagung Festkoerperanalytik
Dates
22-25 Jun 1993.
Place
Chemnitz (Germany).