Published November 15, 2010 | Version v1
Journal article

Effect of deep cryogenic treatment on internal friction behaviors of cold work die steel and their experimental explanation by coupling model

  • 1. School of Materials Science and Engineering, Shanghai University, 149 Yanchang Road, Shanghai 200072 (China)
  • 2. Instrumental Analysis and Research Center,Shanghai University, 99 Shangda road, Shanghai 200444 (China)

Description

Research highlights: → The solute carbon amount in matrix is reduced after DCT treating for the decreasing of Snoek peak height. → The interstitial carbon atoms segregated to nearby dislocations in the process of deep cryogenic treatment. → Interpretation of the experimental data using theoretical coupling model by internal friction. - Abstract: This paper is devoted to the internal friction behaviors in cold work die steel after deep cryogenic treatment (DCT). The experimental results include the Snoek relaxation and their dependence on carbon concentration with the soaking time in liquid nitrogen as well as the Snoek-Ke-Koester (SKK) relaxation and explaining by coupling model which is based on the considering of the cooperative migration of the foreign interstitial atoms C, N, O (FIAs) caused by two kinds of interactions, including the FIAs themselves and between the FIAs with time-dependent strain field of dislocations. The decreasing of the Snoek peak height is indicated that the solute C amount in matrix is reduced after DCT treating. Moreover, the carbon atoms segregated to nearby dislocations producing a strong Snoek-Ke-Koester relaxation.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.msea.2010.08.086

Additional details

Identifiers

DOI
10.1016/j.msea.2010.08.086;
PII
S0921-5093(10)00997-4;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
527
Journal Issue
29-30
Journal Page Range
p. 7950-7954
ISSN
0921-5093
CODEN
MSAPE3

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.