Published April 1977 | Version v1
Journal article Metadata-only

X-ray spectrometric analysis of silicates in geological samples

Creators

  • 1. Zentrales Geologisches Inst., Berlin (German Democratic Republic)

Description

A method for the quantitative X-ray spectral analysis of main and secondary constituents in sediments, metamorphites and magmatites is described, justifying and explaining the preparation of the geological samples by means of dissolution followed by making glass samples. The X-ray spectrometric results were evaluated by an empirical mathematical method using electronic data processing based on Jenkins' model. Results obtained by this rational analytical method are described and compared with rock samples analysed chemically. (author)

Additional details

Additional titles

Original title (German)
Roentgenspektrometrische Silikatanalyse an geologischen Proben

Publishing Information

Journal Title
Silikattechnik (Berlin)
Journal Volume
28
Journal Issue
4
Series
Silikattechnik (Berlin).
Journal Page Range
112-114

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
8329755
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; GEOLOGY; QUANTITATIVE CHEMICAL ANALYSIS; SAMPLE PREPARATION; SILICATES; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; SILICON COMPOUNDS; X-RAY EMISSION ANALYSIS