STM and AFM investigations of surface structures following swift heavy ion irradiation

Samples of highly oriented pyrolitic graphite, muscovite mica and (100) oriented silicon were irradiated with 209 MeV Kr ions. The irradiations were performed in a perpendicular direction to the sample surface. The irradiation fluence used was 1012 ions/cm2. Scanning tunnelling microscope (STM) and atomic force microscope (AFM) observations were accomplished without any further sample preparation. Experimental observations are compared to computer simulations (TRIM code) and primary knock-on atomic spectrum calculations (LET code). Surface features observed on different materials are characterised and compared to each other. Distinction can be made between surface features attributed to nuclear stopping effects and defects owing to electronic stopping mechanisms. (orig.)