An inverted cylindrical sputter magnetron as metal vapor supply for electron cyclotron resonance ion sources
- 1. Fraunhofer Institute for Electron Beam and Plasma Technology, 01277 Dresden (Germany)
- 2. Institute of Solid State Physics, Dresden University of Technology, 01062 Dresden, Germany and Helmholtz-Zentrum Dresden-Rossendorf e.V., Institute of Ion Beam Physics and Materials Research, Dresden (Germany)
- 3. DREEBIT GmbH, 01900 Grossroehrsdorf (Germany)
Description
An inverted cylindrical sputter magnetron device has been developed. The magnetron is acting as a metal vapor supply for an electron cyclotron resonance (ECR) ion source. FEM simulation of magnetic flux density was used to ensure that there is no critical interaction between both magnetic fields of magnetron and ECR ion source. Spatially resolved double Langmuir probe and optical emission spectroscopy measurements show an increase in electron density by one order of magnitude from 1 × 1010 cm−3 to 1 × 1011 cm−3, when the magnetron plasma is exposed to the magnetic mirror field of the ECR ion source. Electron density enhancement is also indicated by magnetron plasma emission photography with a CCD camera. Furthermore, photographs visualize the formation of a localized loss-cone - area, when the magnetron is operated at magnetic mirror field conditions. The inverted cylindrical magnetron supplies a metal atom load rate of R > 1 × 1018 atoms/s for aluminum, which meets the demand for the production of a milliampere Al+ ion beam
Additional details
Identifiers
- DOI
- 10.1063/1.4872381;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 85
- Journal Issue
- 5
- Journal Page Range
- p. 053301-053301.10
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45076089
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM IONS; CAMERAS; CHARGE-COUPLED DEVICES; CYLINDRICAL CONFIGURATION; ECR ION SOURCES; ELECTRON CYCLOTRON-RESONANCE; ELECTRON DENSITY; EMISSION; EMISSION SPECTROSCOPY; FLUX DENSITY; ION BEAMS; LANGMUIR PROBE; MAGNETIC FIELDS; MAGNETIC FLUX; MAGNETIC MIRRORS; MAGNETRONS; PHOTOGRAPHY; PLASMA; VAPORS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CONFIGURATION; CYCLOTRON RESONANCE; ELECTRIC PROBES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUIDS; GASES; ION SOURCES; IONS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OPEN PLASMA DEVICES; PROBES; RESONANCE; SEMICONDUCTOR DEVICES; SPECTROSCOPY; THERMONUCLEAR DEVICES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC