Published November 2007 | Version v1
Journal article Metadata-only

3D quantitative elemental mapping using simultaneous proton induced X-ray emission tomography and scanning transmission ion microscopy tomography

Creators

  • 1. Department of Physics, Centre for Nuclear and Radiation Physics, School of Electronics and Physical Sciences, University of Surrey, Guildford GU2 7XH (United Kingdom)

Description

A technique has been implemented that could produce sub-micron resolution quantitative elemental mapping of cells in an acceptable time frame. A new experimental set-up was installed to produce 3D quantitative elemental maps of biological samples by combining simultaneous proton induced X-ray emission tomography (PIXE-T), on/off-axis scanning transmission ion microscopy tomography (STIM-T) and Rutherford backscattering spectrometry (RBS). Combined with a high efficiency Si(Li) detector, 3D quantitative maps of Cl, S, Ca, K, Fe and Zn in a section of a hair were produced with an analytical time of 3 h

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2007.08.079

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.08.079;
PII
S0168-583X(07)01477-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
264
Journal Issue
2
Journal Page Range
p. 323-328
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39051494
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
EFFICIENCY; EMISSION; HAIR; ION MICROSCOPY; LI-DRIFTED SI DETECTORS; PIXE ANALYSIS; PROTONS; RESOLUTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TOMOGRAPHY; TRANSMISSION; X RADIATION
Descriptors DEC
BARYONS; BODY; CHEMICAL ANALYSIS; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; IONIZING RADIATIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NUCLEONS; ORGANS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SKIN; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.