Published August 13, 2010 | Version v1
Journal article

Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy

  • 1. Departamento de Ciencia de los Materiales e I. M. y Q. I., Universidad de Cadiz, Campus Rio San Pedro, E-11510 Puerto Real, Cadiz (Spain)
  • 2. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
  • 3. Departamento de Lenguajes y Sistemas Informaticos, Universidad de Cadiz, Campus Rio San Pedro, E-11510 Puerto Real, Cadiz (Spain)
  • 4. Instituto de Microelectronica de Madrid (CNM, CSIC), Isaac Newton 8, E-28760 Tres Cantos, Madrid (Spain)
  • 5. UMDO - Unidad Asociada al CSIC-IMM, Instituto de Ciencia de Materiales, Universidad de Valencia, PO Box 22085, 4607 Valencia (Spain)

Description

Evolution of the size, shape and composition of self-assembled InAs/InP quantum wires through the Stranski-Krastanov transition has been determined by aberration-corrected Z-contrast imaging. High resolution compositional maps of the wires in the initial, intermediate and final formation stages are presented. (001) is the main facet at their very initial stage of formation, which is gradually reduced in favour of {114} or {118}, ending with the formation of mature quantum wires with {114} facets. Significant changes in wire dimensions are measured when varying slightly the amount of InAs deposited. These results are used as input parameters to build three-dimensional models that allow calculation of the strain energy during the quantum wire formation process. The observed morphological evolution is explained in terms of the calculated elastic energy changes at the growth front. Regions of the wetting layer close to the nanostructure perimeters have higher strain energy, causing migration of As atoms towards the quantum wire terraces, where the structure is partially relaxed; the thickness of the wetting layer is reduced in these zones and the island height increases until the (001) facet is removed.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/21/32/325706

Additional details

Identifiers

DOI
10.1088/0957-4484/21/32/325706;
PII
S0957-4484(10)51164-4;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
21
Journal Issue
32
Journal Page Range
[8 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43024973
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ARSENIC; ATOMS; INDIUM ARSENIDES; INDIUM PHOSPHIDES; LAYERS; QUANTUM WIRES; RESOLUTION; STRAINS; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; WIRES
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; INDIUM COMPOUNDS; MICROSCOPY; NANOSTRUCTURES; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SEMIMETALS