Structure and electrophysical properties of condensed tellurium films

Interaction of sedimentation conditions, structure and thermoelectric properties of condensed tellurium films on mica is studied. The structure changes of tellurium films on mica depending on sedimentation conditions result from the formation of metastable primary structure and its subsequent recrystallization in the process of condensation when reaching some critical thickness. Electrophysical parameters and thermoelectric properties of tellurium films are mainly determined by their structural defectiveness, which in its turn depends on condensation conditions. The dependence of electrophysic parameters and thermoelectric properties of tellurium films on the thickness is explained by existence of presurface layers with elevated concentration of low mobile holes