On-line SASE FEL gain optimization using COTRI imaging
Description
Overlap of the particle and the photon beams in a self-amplified spontaneous emission (SASE) free-electron laser (FEL) is one of the keys to optimizing gain. We have now directly demonstrated an on-line method for gain improvement at 540 nm on the Advanced Photon Source FEL. This was achieved by steering the e-beam with correctors before an undulator based on the fringe symmetry in coherent optical transition radiation interference (COTRI) images observed after that undulator. For these conditions we determined that both the SASE and COTR image intensities were improved by about a factor of three in one 2.4-m-long undulator section. The initial tuning had been based on RF beam position monitor readings and the maximization of SASE image intensity in the cameras
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2004.04.042;
- PII
- S0168900204006965;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 528
- Journal Issue
- 1-2
- Journal Page Range
- p. 179-183
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 25. international free electron laser conference; 10. FEL users workshop
- Dates
- 8-12 Sep 2003
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36018791
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADVANCED PHOTON SOURCE; BEAM MONITORS; BEAM POSITION; CAMERAS; EMISSION; FREE ELECTRON LASERS; GAIN; IMAGES; INTERFERENCE; OPTIMIZATION; PHOTON BEAMS; SYMMETRY; TRANSITION RADIATION; TUNING
- Descriptors DEC
- AMPLIFICATION; BEAMS; ELECTROMAGNETIC RADIATION; LASERS; MEASURING INSTRUMENTS; MONITORS; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.