Published August 1, 2004 | Version v1
Journal article

On-line SASE FEL gain optimization using COTRI imaging

Description

Overlap of the particle and the photon beams in a self-amplified spontaneous emission (SASE) free-electron laser (FEL) is one of the keys to optimizing gain. We have now directly demonstrated an on-line method for gain improvement at 540 nm on the Advanced Photon Source FEL. This was achieved by steering the e-beam with correctors before an undulator based on the fringe symmetry in coherent optical transition radiation interference (COTRI) images observed after that undulator. For these conditions we determined that both the SASE and COTR image intensities were improved by about a factor of three in one 2.4-m-long undulator section. The initial tuning had been based on RF beam position monitor readings and the maximization of SASE image intensity in the cameras

Additional details

Identifiers

DOI
10.1016/j.nima.2004.04.042;
PII
S0168900204006965;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
528
Journal Issue
1-2
Journal Page Range
p. 179-183
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
25. international free electron laser conference; 10. FEL users workshop
Dates
8-12 Sep 2003
Place
Tsukuba, Ibaraki (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36018791
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADVANCED PHOTON SOURCE; BEAM MONITORS; BEAM POSITION; CAMERAS; EMISSION; FREE ELECTRON LASERS; GAIN; IMAGES; INTERFERENCE; OPTIMIZATION; PHOTON BEAMS; SYMMETRY; TRANSITION RADIATION; TUNING
Descriptors DEC
AMPLIFICATION; BEAMS; ELECTROMAGNETIC RADIATION; LASERS; MEASURING INSTRUMENTS; MONITORS; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.