Phenomenological and microscopical description of scattering on different dislocation arrangements

Two approaches are used to analyse X-ray or neutron scattering by crystals with different dislocation ensembles. Analogy between the above concepts is discussed. The microscopical approach takes into account the detailed displacement field due to different types of dislocation arrangement in the crystal. Frequently a phenomenological concept operating with the ideas of displacements, strains and stresses arising in the materials under deformation is applied. Unfortunately, the phenomenological concept cannot take into account that similar stress distributions may have significantly different microscopic reasons. The comparison of the results obtained by both phenomenological and microscopic descriptions of scattering enables us to understand the connection between different types of strains and stresses in the crystal with the type of the defects in it. (orig.)