Published June 2013 | Version v1
Journal article

Reflections on hard X-ray photon-in/photon-out spectroscopy for electronic structure studies

  • 1. European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, 38043 Grenoble (France)
  • 2. Department of Inorganic, Physical and Materials Chemistry, INSTM Reference Center and NIS Centre of Excellence, Università di Torino, Via P. Giuria 7, I-10125 Torino (Italy)
  • 3. Research Center for Nanoscale Structure of Matter, Southern Federal University, str. Zorge 5, 344090 Rostov-on-Don (Russian Federation)

Description

Highlights: ► Overview of some recent developments in hard X-ray RXES/RIXS. ► Evaluation of spectral line broadening in RXES/RIXS. ► Modelling of RXES/RIXS by ground state DFT calculations. ► Discussion on when HERFD provides a good approximation to XAS. -- Abstract: An increasing community of researchers in various fields of natural sciences is combining X-ray absorption with X-ray emission spectroscopy (XAS–XES) to study electronic structure. With the applications becoming more diverse, the objectives and the requirements in photon-in/photon-out spectroscopy are becoming broader. It is desirable to find simple experimental protocols, robust data reduction and theoretical tools that help the experimentalist to understand their data and learn about the electronic structure. This article presents a collection of considerations on non-resonant and resonant XES with the aim to guide the experimentalist to make good use of this technique

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2012.09.004

Additional details

Identifiers

DOI
10.1016/j.elspec.2012.09.004;
PII
S0368-2048(12)00114-4;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
188
Journal Page Range
p. 17-25
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.