Published January 19, 2007 | Version v1
Journal article

A New Attachment of the Large Debye-Scherrer Camera at BL02B2 of the SPring-8 for Thin Film X-ray Diffraction

  • 1. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
  • 2. CREST/JST, Honcho, Kawaguchi, Saitama 332-0012 (Japan)
  • 3. RIKEN, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)

Description

We have developed a new attachment for thin film x-ray measurements equipped with the large Debye-Scherrer camera at BL02B2 of the SPring-8. It is quite easy to handle and control the attachment using user-friendly computer programs. It is also notable that the attachment realizes both low-glancing-angle incident beam condition and in-plane measurement condition. The attachment enables us to measure high precision x-ray diffraction data from many kinds of thin films with the Debye-Scherrer camera. Using this attachment we try to analyze some dimensionally controlled thin film structures

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
879
Journal Issue
1
Journal Page Range
p. 1771-1774
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international conference on synchrotron radiation instrumentation
Dates
28 May - 2 Jun 2006
Place
Daegu (Korea, Republic of)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39061464
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; CAMERAS; COMPUTER CODES; CONTROL; CRYSTAL STRUCTURE; SPRING-8 STORAGE RING; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; FILMS; RADIATION SOURCES; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES

Optional Information

Notes
(c) 2007 American Institute of Physics