Published June 1989 | Version v1
Journal article

Investigation of fluctuations of the electrical resistivity of γ-doped silicon

Description

An investigation was made of fluctuations of the electrical resistivity of p-type silicon doped with aluminum by nuclear reactions induced as a result of bombardment with γ rays, which introduced impurity atoms in concentrations up to 1014 cm-3. The γ-doping method made is possible to prepare p-type silicon single crystals with resistivity macroinhomogeneities and microinhomogeneities amounting to a few percent

Additional details

Publishing Information

Journal Title
Soviet Physics - Semiconductors (English Translation)
Journal Volume
23
Journal Issue
6
Series
Sov. Phys. - Semicond. (Engl. Transl.).
Journal Page Range
679-681
ISSN
0038-5700
CODEN
SPSEA

Optional Information

Notes
Cover-to-cover translation of Fizika i Tekhnika Poluprovodnikov (US SR).