Published July 1987
| Version v1
Report
Four-channel Si detector for X-ray measurements
Description
A new four-channel surface barrier detector was developed for soft X-ray measurements in a dense plasma heated with relativistic electron beams. Detector sensitivity in the range 100 to 275 eV was estimated to be 3 to 5.1010 A/W. The detector was designed for direct operation in a high vacuum. It is therefore suitable for spectral measurements in the ultrasoft X-ray region, e.g., by using very thin zapon lacquer filters. The detector was tested in the REBEX experimental facility and the results compared with those obtained by means of vacuum photodiodes. (J.U.)
Additional details
Publishing Information
- Imprint Title
- 14th Czechoslovak seminar on plasma physics and technology. Part II
- Imprint Pagination
- 188 p.
- Journal Page Range
- p. 67-68.
- Report number
- IPPCZ--277/II
Conference
- Title
- 14. Czechoslovak seminar on plasma physics and technology.
- Dates
- 3-6 Mar 1987.
- Place
- Liblice (Czechoslovakia).
INIS
- Country of Publication
- Serbia and Montenegro
- Country of Input or Organization
- Serbia and Montenegro
- INIS RN
- 20004569
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON TEMPERATURE; ELECTRONS; ENERGY SPECTRA; HOT PLASMA; PLASMA DIAGNOSTICS; SENSITIVITY; SI SEMICONDUCTOR DETECTORS; SOFT X RADIATION; SURFACE BARRIER DETECTORS; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LEPTONS; MEASURING INSTRUMENTS; PLASMA; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROSCOPY; X RADIATION