Published January 2015 | Version v1
Journal article

Framed carbon nanostructures: Synthesis and applications in functional SPM tips

  • 1. ITMO University, Kronverksky pr. 49, 197101 St. Petersburg (Russian Federation)
  • 2. St. Petersburg Academic University, Khlopina 8/3, 194021 St. Petersburg (Russian Federation)
  • 3. Ioffe Physical Technical Institute of the Russian Academy of Sciences, Politekhnicheskaya 26, 194021 St. Petersburg (Russian Federation)
  • 4. Institute for Analytical Instrumentation of the Russian Academy of Sciences, Rizhsky 26, 190103 St. Petersburg (Russian Federation)

Description

We present a synthesis method to fabricate framed carbon-based nanostructures having highly anisotropic shapes, in particular, the nanofork and nanoscalpel structures which are obtained systematically under optimized growth conditions. A theoretical model is developed to explain the formation of such nanostructures on Si cantilevers and W etched wires exposed to a focused electron beam. We then demonstrate the potentials of these nanostructures as functional tips for scanning probe microscopy. Owing to their anisotropic shapes, such tips can be very useful for nanolithography, nanosurgery of biological objects, and precise manipulation with surface particles. Overall, our method provides a simple and robust way to produce functional scanning probe microscopy tips with variable shapes and enhanced capabilities for different applications compared to standard cantilevers. - Highlights: • We present a synthesis method to fabricate framed carbon-based nanostructures. • Under focused electron beam we fabricate nanofork and nanoscalpel structures. • A theoretical model is developed to explain the formation of such nanostructures. • We demonstrate the potentials of these nanostructures as functional tips for SPM. • Our method provides a simple and robust way to produce functional SPM tips

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2014.10.008

Additional details

Identifiers

DOI
10.1016/j.ultramic.2014.10.008;
PII
S0304-3991(14)00200-9;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
148
Journal Page Range
p. 151-157
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46101064
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CARBON; ELECTRON BEAMS; MICROSCOPY; NANOSTRUCTURES; SURFACES; SYNTHESIS
Descriptors DEC
BEAMS; ELEMENTS; LEPTON BEAMS; NONMETALS; PARTICLE BEAMS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.