Published March 1, 2018 | Version v1
Journal article

Integrated readout electronics for Belle II pixel detector

  • 1. IPE, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, Eggenstein-Leopoldshafen (Germany)

Description

This paper describes the readout components for Belle II that have been designed as integrated circuits. The ICs are connected to DEPFET sensor by bump bonding. Three types of ICs have been developed: SWITCHER for pixel matrix control, DCD for readout and digitizing of sensor signals and DHP for digital data processing. The ICs are radiation tolerant and use several novel features, such as the multiple-input differential amplifiers and the fast and radiation hard high-voltage drivers. SWITCHER and DCD have been developed at University of Heidelberg, Karlsruhe Institute of Technology (KIT) and DHP at Bonn University. The IC-development started in 2009 and was accomplished in 2016 with the submissions of final designs. The final ICs for Belle II pixel detector and the related measurement results will be presented in this contribution.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/13/03/C03001

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
13
Journal Issue
03
Journal Page Range
p. C03001
ISSN
1748-0221

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51047404
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
AMPLIFIERS; DATA PROCESSING; DESIGN; INTEGRATED CIRCUITS; READOUT SYSTEMS; SENSORS; SIGNALS
Descriptors DEC
ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MICROELECTRONIC CIRCUITS; PROCESSING