Investigation of the microstructure, mechanical properties and tribological behaviors of Ti-containing diamond-like carbon films fabricated by a hybrid ion beam method
- 1. Future Convergence Technology Division, Korea Institute of Science and Technology, Seoul, 130-650 (Korea, Republic of)
- 2. Ningbo Key Laboratory of Marine Protection Materials, Division of Surface Engineering, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201 (China)
Description
Diamond-like carbon (DLC) films with various titanium contents were investigated using a hybrid ion beam system comprising an anode-layer linear ion beam source and a DC magnetron sputtering unit. The film composition and microstructure were characterized carefully by X-ray photoelectron spectroscopy, transmission electron microscopy and Raman spectroscopy, revealing that the doped Ti atoms had high solubility in the DLC films. The maximum solubility was found to lie between about 7 and 13 at.%. When the Ti content was lower than this solubility, the doped Ti atoms dissolved in the DLC matrix and the films exhibited the typical features of the amorphous DLC structure and displayed low compressive stresses, friction coefficients and wear rates. However, as the doped content exceeded the solubility, Ti atoms bonded with C atoms, resulting in the formation of carbide nano-particles embedded in the DLC matrix. Although the emergence of the carbide nano-particles promoted graphitizing due to a catalysis effect, the film hardness was enhanced to a great extent. On the other hand, the hard carbides particles caused abrasive wear behavior, inducing a high friction coefficient and wear rate. - Highlights: ► Ti doped DLC films (Ti ∼ 24 at.% )were deposited by a hybrid ion beam system. ► Solubility of the Ti atoms in the DLC films was found around 7 ∼ 13 at .%. ► Microstructure evolution from DLC to nanocomposite played key role in film behaviors.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.04.016Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.04.016;
- PII
- S0040-6090(12)00447-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 19
- Journal Page Range
- p. 6057-6063
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44103491
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABRASIVES; CARBIDES; CATALYSIS; DEPOSITION; DEPOSITS; DIAMONDS; DOPED MATERIALS; FILMS; FRICTION FACTOR; HARDNESS; ION BEAMS; MAGNETRONS; MICROSTRUCTURE; RAMAN SPECTROSCOPY; SOLUBILITY; STRESSES; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY; TRIBOLOGY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BEAMS; CARBON; CARBON COMPOUNDS; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; LASER SPECTROSCOPY; MATERIALS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.