Achievements and perspectives of CMOS pixel sensors for charged particle tracking
Description
Main achievements of more than one decade of CMOS pixel sensor R and D for charged particle tracking are reviewed in this paper, together with the goals driving present R and D activities, i.e. read-out speed and radiation tolerance. A fast read-out sensor developed for the EUDET beam telescope and the STAR vertex detector is described as well as its first test results. Preliminary results are also provided on non-ionising radiation tolerance improvements offered by CMOS processes featuring a depleted epitaxial layer. Finally, the recent access to 3D Integration Technologies, which alleviate most essential CMOS sensor's limitations, has translated into 2- and 3-tier sensor designs, to be fabricated in Spring 2009. Their main design features and expected performances are reviewed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.02.192Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.02.192;
- PII
- S0168-9002(10)00477-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 623
- Journal Issue
- 1
- Journal Page Range
- p. 192-194
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 1. international conference on technology and instrumentation in particle physics
- Dates
- 12-17 Mar 2009
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42014748
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CHARGED PARTICLES; DESIGN; EPITAXY; IONIZING RADIATIONS; LAYERS; PERFORMANCE; READOUT SYSTEMS; SENSORS; SI MICROSTRIP DETECTORS; SPRINGS; TELESCOPES; TOLERANCE
- Descriptors DEC
- CRYSTAL GROWTH METHODS; MACHINE PARTS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.