Published October 1, 2010 | Version v1
Journal article

High definition surface micromachining of LiNbO3 by ion implantation

  • 1. Carlo Gavazzi Space SpA, Sede di Bologna and Laboratory MIST E.R., Via P. Gobetti 101, I-40129 Bologna (Italy)
  • 2. Consiglio Nazionale delle Ricerche - Istituto per la Microelettronica e i Microsistemi (CNR-IMM) and Laboratory MIST E.R., Via P. Gobetti 101, I-40129 Bologna (Italy)

Description

High Energy Ion Implantation (HEII) of both medium and light mass ions has been successfully applied for the surface micromachining of single crystal LiNbO3 (LN) substrates. It has been demonstrated that the ion implantation process generates high differential etch rates in the LN implanted areas, when suitable implantation parameters, such as ion species, fluence and energy, are chosen. In particular, when traditional LN etching solutions are applied to suitably ion implanted regions, etch rates values up to three orders of magnitude higher than the typical etching rates of the virgin material, are registered. Further, the enhancement in the etching rate has been observed on x, y and z-cut single crystalline material, and, due to the physical nature of the implantation process, it is expected that it can be equivalently applied also to substrates with different crystallographic orientations. This technique, associated with standard photolithographic technologies, allows to generate in a fast and accurate way very high aspect ratio relief micrometric structures on LN single crystal surface. In this work a description of the developed technology is reported together with some examples of produced micromachined structures: in particular very precisely defined self sustaining suspended structures, such as beams and membranes, generated on LN substrates, are presented. The developed technology opens the way to actual three dimensional micromachining of LN single crystals substrates and, due to the peculiar properties characterising this material, (pyroelectric, electro-optic, acousto-optic, etc.), it allows the design and the production of complex integrated elements, characterised by micrometric features and suitable for the generation of advanced Micro Electro Optical Systems (MEOS).

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2010.05.038

Additional details

Identifiers

DOI
10.1016/j.nimb.2010.05.038;
PII
S0168-583X(10)00456-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
268
Journal Issue
19
Journal Page Range
p. 3049-3054
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
15. international conference on radiation effects in insulators (REI)
Dates
30 Aug - 4 Sep 2009
Place
Padova (Italy)

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.