Published March 1997
| Version v1
Journal article
Specific Heat and Scaling of 4He Confined in a Planar Geometry
Creators
- 1. State University of New York at Buffalo, Buffalo, New York 14260 (United States)
Description
We report measurements of the specific heat of thick helium films to test scaling predictions near the superfluid transition, Tλ. These films, bounded by two silicon wafers, range in thickness from 0.107 to 0.692μm. The specific heat of the films is suppressed relative to that of bulk helium, and the difference of the data from bulk helium scales well with the exponent of the correlation length. We propose an empirical scaling function which fits the data well for T>Tλ, and yields the surface specific heat. We also compare the data with various theoretical calculations and experiments. We find that the calculations underestimate the effect of confinement. copyright 1997 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 78
- Journal Issue
- 13
- Journal Page Range
- p. 2596-2599.
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28080844
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- FILMS; HELIUM; HELIUM 4; SCALING LAWS; SIZE; SPECIFIC HEAT; SURFACE PROPERTIES; TRANSITION TEMPERATURE
- Descriptors DEC
- ELEMENTS; EVEN-EVEN NUCLEI; HELIUM ISOTOPES; ISOTOPES; LIGHT NUCLEI; NONMETALS; NUCLEI; PHYSICAL PROPERTIES; RARE GASES; STABLE ISOTOPES; THERMODYNAMIC PROPERTIES