Radiation damage of germanium detectors
Description
In the course of a continuing study of the proton damage of germanium detectors, a reverse electrode configuration coaxial detector that had been fabricated at Lawrence Berkeley Laboratory (LBL) five years ago and a 1 cm thick planar detector made from the same crystal were irradiated with 5.1 GeV protons in a recent experiment. These detectors were irradiated simultaneously--there were actually a total of five detectors in line. The coaxial detector was considerably less sensitive to the high-energy proton damage than was the planar detector. These data indicate a factor of approx. 3. This would imply a factor of approx. 60 when comparing coaxial detectors having the opposite electrode configuration. Although additional experiments must be done, the evidence is now quite strong that coaxial germanium detectors having the n+ contact on the coaxial periphery should not be used in any situation subject to significant radiation damage such as on an extended mission in space
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.Files
10461851.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 10 p.
- Report number
- LBL--7967
Conference
- Title
- 1978 gamma ray spectroscopy in astrophysics symposium.
- Dates
- 28 - 29 Apr 1978.
- Place
- Greenbelt, MD, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 10461851
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ENERGY RESOLUTION; EXPERIMENTAL DATA; GE SEMICONDUCTOR DETECTORS; GRAPHS; PHYSICAL RADIATION EFFECTS; PROTONS; SENSITIVITY
- Descriptors DEC
- BARYONS; CATIONS; CHARGED PARTICLES; DATA; DATA FORMS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; INFORMATION; IONS; MEASURING INSTRUMENTS; NUCLEONS; NUMERICAL DATA; RADIATION DETECTORS; RADIATION EFFECTS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Secondary number(s)
- CONF-7804113--1.