Chemical interaction of B4C, B, and C with Mo/Si layered structures
Creators
- 1. FOM Institute for Plasma Physics Rijnhuizen, P.O. Box 1207, 3430 BE Nieuwegein (Netherlands)
- 2. Department of Materials Science and Engineering, Delft University of Technology, Mekelweg 2, 2628 CD Delft (Netherlands)
- 3. Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, BESSY II, Albert-Einstein Strasse 15, 12489 Berlin (Germany)
- 4. MESA Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede (Netherlands)
Description
To enhance the thermal stability, B4C diffusion barrier layers are often added to Mo/Si multilayer structures for extreme ultraviolet optics. Knowledge about the chemical interaction between B4C and Mo or Si, however is largely lacking. Therefore, the chemical processes during annealing up to 600 deg. C of a Mo/B4C/Si layered structure have been investigated in situ with hard x-ray photoelectron spectroscopy and ex situ with depth profiling x-ray photoelectron spectroscopy. Mo/B/Si and Mo/C/Si structures have also been analyzed as reference systems. The chemical processes in these systems have been identified, with two stages being distinguished. In the first stage, B and C diffuse and react predominantly with Mo. MoSix forms in the second stage. If the diffusion barrier consists of C or B4C, a compound forms that is stable up to the maximum probed temperature and annealing time. We suggest that the diffusion barrier function of B4C interlayers as reported in literature can be caused by the stability of the formed compound, rather than by the stability of B4C itself.
Additional details
Identifiers
- DOI
- 10.1063/1.3503521;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 108
- Journal Issue
- 9
- Journal Page Range
- p. 094314-094314.6
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42070057
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; BORON; BORON CARBIDES; CARBON; DIFFUSION BARRIERS; EXTREME ULTRAVIOLET RADIATION; HARD X RADIATION; INTERFACES; LAYERS; MOLYBDENUM; OPTICS; PHASE STABILITY; SEMICONDUCTOR MATERIALS; SILICON; TEMPERATURE DEPENDENCE; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; HEAT TREATMENTS; IONIZING RADIATIONS; MATERIALS; METALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; REFRACTORY METALS; SEMIMETALS; SPECTROSCOPY; STABILITY; TRANSITION ELEMENTS; ULTRAVIOLET RADIATION; X RADIATION
Optional Information
- Notes
- (c) 2010 American Institute of Physics