Physico-chemical characteristics of high performance polymer modified by low and atmospheric pressure plasma
Creators
- 1. Sikkim Manipal Inst. of Technology, Majhitar, Rangpo, East Sikkim, 737136, East Sikkim (India)
- 2. Faculty of Aerospace Engineering, Delft Univ. of Technology, Delft (Netherlands)
- 3. Singapore Inst. for Manufacturing Technology, 71 Nanyang Drive, 638075, Singapore (Singapore)
- 4. Surface Physics and Nanostructures Group (EMD), National Physical Lab. (CSIR), K.S. Krishnan Marg, New Delhi, 110012, New Delhi (India)
- 5. Dept. of Aerospace Engineering, KAIST, Daejeon (Korea, Republic of)
Description
In this work, the effect of low pressure plasma and atmosphericpressure plasma treatment on surface properties and adhesion characteristics of high performance polymer, Polyether Ether Ketone (PEEK) are investigated in terms of Fourier Transform Infrared Spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), and Atomic Force Microscopy (AFM). The experimental results show that the PEEK surface treated by atmospheric pressure plasma lead to an increase in the polar component of the surface energy, resulting in improving the adhesion characteristics of the PEEK/Epoxy adhesive system. Also, the roughness of the treated surfaces is largely increased as confirmed by AFM observation. These results can be explained by the fact that the atmospheric pressure plasma treatment of PEEK surface yields several oxygen functionalities on hydrophobic surface, which play an important role in increasing the surface polarity, wettability, and the adhesion characteristics of the PEEK/Epoxy adhesive system. (authors)
Additional details
Publishing Information
- Journal Title
- Ehlektronnaya Obrabotka Materialov
- Journal Volume
- 48
- Journal Issue
- 2
- Journal Page Range
- p. 31-42
- ISSN
- 0013-5739
INIS
- Country of Publication
- Moldova, Republic of
- Country of Input or Organization
- Moldova, Republic of
- INIS RN
- 43072137
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADHESION; ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; FOURIER TRANSFORMATION; ORGANIC POLYMERS; PLASMA; POLYMERS; SURFACE ENERGY; SURFACE PROPERTIES; TENSILE PROPERTIES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ELECTRON SPECTROSCOPY; ENERGY; FREE ENERGY; INTEGRAL TRANSFORMATIONS; MECHANICAL PROPERTIES; MICROSCOPY; ORGANIC COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; POLYMERS; SPECTROSCOPY; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSFORMATIONS
Optional Information
- Notes
- 26 refs., 4 tabs., 12 figs., For English version of the journal see 'Surface Engineering and Applied Electrochemistry' (Springer)