Published May 2013 | Version v1
Journal article

Ion-irradiation-induced ferromagnetism in undoped ZnO thin films

  • 1. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695 (United States)
  • 2. Materials Science Division, Army Research Office, Research Triangle Park, NC 27709 (United States)
  • 3. Materials Science Group, Inter University Accelerator Centre, Aruna Asaf Ali Marg, PO Box 10502, New Delhi 110 067 (India)

Description

We have introduced defects in ZnO epitaxial thin films by swift heavy 107Ag9+ ion irradiation and investigated systematically their magnetic, electrical and optical properties. Oxygen annealed ZnO films are epitaxial single crystals that exhibit no long-range magnetic order. However, in this paper it is shown that room-temperature ferromagnetism (RTFM) can be introduced in a controlled manner in these films using ion irradiation and that the magnetization increases with ion dose. This qualitatively agrees with earlier studies which showed that RTFM could be induced in ZnO films through either vacuum thermal annealing or pulsed laser annealing below energy densities that lead to melting. Raman studies of the ion irradiated samples revealed dramatic changes in the vibration modes that correlated with increases in the carrier concentration, indicative of lattice disorder and defect creation. We compare these results with those observed in laser irradiated and vacuum annealed samples, and then discuss these findings in the context of defects and defect complexes created during the high-energy heavy ion irradiation process. We propose a unified mechanism to explain RTFM and n-type conductivity enhancements during irradiation, and laser and vacuum annealing

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2012.09.071

Additional details

Identifiers

DOI
10.1016/j.actamat.2012.09.071;
PII
S1359-6454(12)00704-5;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
61
Journal Issue
8
Journal Page Range
p. 2763-2768
ISSN
1359-6454
CODEN
ACMAFD

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.