Magnetization reversal and anisotropy in CoO/permalloy/Cu/permalloy/NiO layered structures
Description
This work presents results on the temperature dependence of the hysteretic processes of glass /CoO/permalloy/Cu/permalloy/NiO layered structures. The antiferromagnetic behavior of both oxides below their different blocking temperatures leads to the apparition of unidirectional anisotropy and enhancement of coercivity in the permalloy layers. The magnetization reversal is influenced by the exchange coupling between the permalloy layers, which is controlled by the Cu thickness. Both ferromagnetic layers remain uncoupled for 7.5 nm Cu thickness and are coupled for 1.5 nm. The hysteresis loops measured along different directions of the samples at room temperature point out the different features in the magnetization processes of systems with uniaxial and/or unidirectional anisotropies
Additional details
Identifiers
- PII
- S0304885300010374;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 226-230
- Journal Issue
- 1-3
- Journal Page Range
- p. 1764-1766
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34002835
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; ANTIFERROMAGNETISM; COBALT OXIDES; COERCIVE FORCE; COPPER; FERROMAGNETIC MATERIALS; GLASS; HYSTERESIS; LAYERS; MAGNETIZATION; NICKEL OXIDES; PERMALLOY; SPIN; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; THICKNESS; THIN FILMS; VALVES
- Descriptors DEC
- ALLOYS; ANGULAR MOMENTUM; CHALCOGENIDES; COBALT COMPOUNDS; CONTROL EQUIPMENT; DIMENSIONS; ELEMENTS; EQUIPMENT; FILMS; FLOW REGULATORS; IRON ALLOYS; MAGNETIC MATERIALS; MAGNETISM; MATERIALS; METALS; NICKEL ALLOYS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.