Anelastic deformation of Pb(Zr,Ti)O3 thin films by non-180 deg. ferroelectric domain wall movements during nanoindentation
- 1. Swiss Federal Institute of Technology, 1015 Lausanne (Switzerland)
- 2. Department of Materials, Queen Mary University of London, Mile End Road, London, E1 4NS (United Kingdom)
Description
Lead zirconate titanate Pb(Zr,Ti)O3 ferroelectric thin films show significant anelastic deformation when indented with spherical tipped indenters. Experiments on films with different Zr/Ti ratio and a mixed <001>,<100> preferred crystallographic orientation have shown that there is a good agreement between the anelastic deformation and the maximum strain achievable by non-180 deg. domain wall movement. An expected increase of the indentation stiffness of the films also accompanies the anelastic deformation because of the single crystal elastic anisotropy. All these observations seem to indicate that non-180 deg. ferroelectric domain wall movements occur under indentation stresses and cause anelasticity. Stresses for maximum anelastic deformation are compared with those for recently reported stress-induced depolarization
Additional details
Identifiers
- DOI
- 10.1063/1.1491291;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 81
- Journal Issue
- 3
- Journal Page Range
- p. 421-423
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35024317
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CERAMICS; CRYSTALLOGRAPHY; DEFORMATION; ELASTICITY; FERROELECTRIC MATERIALS; NANOSTRUCTURES; PZT; SPHERICAL CONFIGURATION; STRESSES; TEXTURE; THIN FILMS; WALLS
- Descriptors DEC
- CONFIGURATION; DIELECTRIC MATERIALS; FILMS; LEAD COMPOUNDS; MATERIALS; MECHANICAL PROPERTIES; OXYGEN COMPOUNDS; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONATES; ZIRCONIUM COMPOUNDS
Optional Information
- Notes
- (c) 2002 American Institute of Physics.