Published July 15, 2002 | Version v1
Journal article

Anelastic deformation of Pb(Zr,Ti)O3 thin films by non-180 deg. ferroelectric domain wall movements during nanoindentation

  • 1. Swiss Federal Institute of Technology, 1015 Lausanne (Switzerland)
  • 2. Department of Materials, Queen Mary University of London, Mile End Road, London, E1 4NS (United Kingdom)

Description

Lead zirconate titanate Pb(Zr,Ti)O3 ferroelectric thin films show significant anelastic deformation when indented with spherical tipped indenters. Experiments on films with different Zr/Ti ratio and a mixed <001>,<100> preferred crystallographic orientation have shown that there is a good agreement between the anelastic deformation and the maximum strain achievable by non-180 deg. domain wall movement. An expected increase of the indentation stiffness of the films also accompanies the anelastic deformation because of the single crystal elastic anisotropy. All these observations seem to indicate that non-180 deg. ferroelectric domain wall movements occur under indentation stresses and cause anelasticity. Stresses for maximum anelastic deformation are compared with those for recently reported stress-induced depolarization

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
81
Journal Issue
3
Journal Page Range
p. 421-423
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2002 American Institute of Physics.