Diamond and silicon pixel detectors in high radiation environments
Description
Diamond pixel detector is a promising candidate for tracking of collider experiments because of the good radiation tolerance of diamond. The diamond pixel detector must withstand the radiation damage from 1016 particles per cm2, which is the expected total fluence in High Luminosity Large Hadron Collider. The performance of diamond and silicon pixel detectors are evaluated in this research in terms of the signal-to-noise ratio (SNR). Single-crystal diamond pixel detectors with the most recent readout chip ATLAS FE-I4 are produced and characterized. Based on the results of the measurement, the SNR of diamond pixel detector is evaluated as a function of radiation fluence, and compared to that of planar-silicon ones. The deterioration of signal due to radiation damage is formulated using the mean free path of charge carriers in the sensor. The noise from the pixel readout circuit is simulated and calculated with leakage current and input capacitance to the amplifier as important parameters. The measured SNR shows good agreement with the calculated and simulated results, proving that the performance of diamond pixel detectors can exceed the silicon ones if the particle fluence is more than 1015 particles per cm2.
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43127098.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 111 p.
- ISSN
- 0172-8741
- Report number
- BONN-IR--2012-05
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 43127098
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- CAPACITANCE; CHARGE TRANSPORT; CRYSTAL COUNTERS; DIAMONDS; LEAKAGE CURRENT; MEAN-FIELD THEORY; MONOCRYSTALS; NOISE; PHYSICAL RADIATION EFFECTS; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SIMULATION
- Descriptors DEC
- CARBON; CRYSTALS; CURRENTS; DIMENSIONLESS NUMBERS; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; MEASURING INSTRUMENTS; MINERALS; NONMETALS; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS