Published 2008
| Version v1
Miscellaneous
Open
Site occupancies in the R2-xFe14+2xSi3 (R = Ce, Nd, Gd, Dy, Ho, Er, Lu, Y) compounds studied by Moessbauer spectroscopy
Creators
- 1. Moessbauer Spectroscopy Division, Institute of Physics, Pedagogical University, ul. Podchorazych 2, 30-084 Cracow (Poland)
- 2. Solid State Physics Department, Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow (Poland)
- 3. Surface Physics Division, Institute of Physics, Pedagogical University, ul. Podchorazych 2, 30-084 Cracow (Poland)
- 4. Institute of Physics, Academy of Sciences, Na Slovance 2, 18221 Prague (Czech Republic)
Description
no abstract available
Files
39114226.pdf
Files
(163.0 kB)
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Additional details
Identifiers
Publishing Information
- Publisher
- Academic Publishing House of the Pedagogical University of Cracow
- Imprint Title
- OSSM2008 Polish Moessbauer Community Meeting: Program, Abstracts and List of Participants
- Imprint Pagination
- 117 p.
- Journal Page Range
- p. 40
- Report number
- INIS-PL--2008-0017
Conference
- Title
- Polish Moessbauer Community Meeting
- Acronym
- OSSM2008
- Dates
- 8-11 Jun 2008
- Place
- Koniki (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 39114226
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- CERIUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CZOCHRALSKI METHOD; DYSPROSIUM COMPOUNDS; ERBIUM COMPOUNDS; GADOLINIUM COMPOUNDS; HOLMIUM COMPOUNDS; INTERMETALLIC COMPOUNDS; IRON 57; IRON COMPOUNDS; LUTETIUM COMPOUNDS; MOESSBAUER EFFECT; NEODYMIUM COMPOUNDS; SILICIDES; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; EVEN-ODD NUCLEI; INTERMEDIATE MASS NUCLEI; IRON ISOTOPES; ISOTOPES; NUCLEI; RARE EARTH COMPOUNDS; SCATTERING; SILICON COMPOUNDS; STABLE ISOTOPES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- 1 ref.