Published February 2018 | Version v1
Journal article

Effective X-ray elastic constant of cast iron

  • 1. Linköping University, Department of Management and Engineering, Division of Engineering Materials (Sweden)

Description

X-ray diffraction is a non-destructive method used for strain measurements in crystalline materials. Conversion of strain to stress can be achieved using the X-ray elastic constants (XEC), s1 and ½s2. The sin2#psi# method was used during in situ loading to determine XEC for flake, vermicular, and spherical graphite iron. A fully pearlitic steel was used as reference. Uniaxial testing was conducted on the cast iron to create a homogeneous strain field, as well as four-point bending in both tension and compression due to the tension/compression asymmetry. The commonly used XEC value ½s2 = 5.81 × 10−6 MPa−1 is theoretically derived from an α-Fe single crystal. When investigating materials that contain ferrite, such as polycrystalline cast iron, this value is not accurate. Determination of an effective XEC for polycrystalline cast iron yields a better correlation between the measured microstrains and the properties observed on a macroscopic scale. The need for an effective XEC is evident, especially when it comes to model validation of, for example, casting simulations. Effective XEC values have been determined for flake, vermicular, and spherical graphite iron. The determined value is lower than the theoretical value.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science
Journal Volume
53
Journal Issue
4
Journal Page Range
p. 2766-2773
ISSN
0022-2461
CODEN
JMTSAS

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49105917
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CAST IRON; CASTINGS; SOCIO-ECONOMIC FACTORS; STRAINS; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; DIFFRACTION; INSTITUTIONAL FACTORS; IRON ALLOYS; IRON BASE ALLOYS; SCATTERING; SILICON ALLOYS; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2017 The Author(s)
Notes
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