Published 2020 | Version v1
Journal article

Application of the Vernier method for absolute distance metrology with CW TOF phase shift technique

  • 1. Departamento de Física, Faculdade de Ciências, Universidade de Lisboa, Edifício C8, Campo Grande, PT1749-016 Lisbon (Portugal)
  • 2. Instituto de Astrofísica e Ciências do Espaço, Universidade de Lisboa, Campo Grande, PT1749-016 Lisboa (Portugal)

Description

A phase shift time of flight technique determines a position by comparing the phase angle of a continuously modulated signal in the source and its reflection on a target. However, due to its cyclical properties, the position information is contained within an ambiguity interval. For an absolute measurement, this interval is repeated N times plus a residual part given by the phase shift. In this work we propose an application of the Vernier method to determine N and a setup for mid-range applications (10-20) m with a 3 GHz amplitude modulated source to allow accuracies ≤ 100 μm.

Availability note (English)

Available from https://www.epj-conferences.org/articles/epjconf/pdf/2020/14/epjconf_eosam2020_06016.pdf; https://doaj.org/article/ccd34aa883c14d258ffbe1733ba6b455

Additional details

Publishing Information

Journal Title
EPJ. Web of Conferences
Journal Volume
238
Journal Page Range
vp.
ISSN
2100-014X

Conference

Title
EOS (European Optical Society) Annual Meeting
Acronym
EOSAM 2020
Dates
7-11 Sep 2020
Place
Porto (Portugal)

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
53093354
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; GHZ RANGE; METROLOGY; PHASE SHIFT; REFLECTION; SIGNALS; TIME-OF-FLIGHT METHOD
Descriptors DEC
FREQUENCY RANGE