Published 2020
| Version v1
Journal article
Application of the Vernier method for absolute distance metrology with CW TOF phase shift technique
- 1. Departamento de Física, Faculdade de Ciências, Universidade de Lisboa, Edifício C8, Campo Grande, PT1749-016 Lisbon (Portugal)
- 2. Instituto de Astrofísica e Ciências do Espaço, Universidade de Lisboa, Campo Grande, PT1749-016 Lisboa (Portugal)
Description
A phase shift time of flight technique determines a position by comparing the phase angle of a continuously modulated signal in the source and its reflection on a target. However, due to its cyclical properties, the position information is contained within an ambiguity interval. For an absolute measurement, this interval is repeated N times plus a residual part given by the phase shift. In this work we propose an application of the Vernier method to determine N and a setup for mid-range applications (10-20) m with a 3 GHz amplitude modulated source to allow accuracies ≤ 100 μm.
Availability note (English)
Available from https://www.epj-conferences.org/articles/epjconf/pdf/2020/14/epjconf_eosam2020_06016.pdf; https://doaj.org/article/ccd34aa883c14d258ffbe1733ba6b455Additional details
Identifiers
Publishing Information
- Journal Title
- EPJ. Web of Conferences
- Journal Volume
- 238
- Journal Page Range
- vp.
- ISSN
- 2100-014X
Conference
- Title
- EOS (European Optical Society) Annual Meeting
- Acronym
- EOSAM 2020
- Dates
- 7-11 Sep 2020
- Place
- Porto (Portugal)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 53093354
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; GHZ RANGE; METROLOGY; PHASE SHIFT; REFLECTION; SIGNALS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- FREQUENCY RANGE